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dc.contributor.authorDavid, Gerhard
dc.contributor.authorYun, Tae-Yeoul
dc.contributor.authorCrites, Matthew H.
dc.contributor.authorWhitaker, John F.
dc.contributor.authorWeatherford, Todd R.
dc.contributor.authorJobe, Kay
dc.contributor.authorMeyer, Scott
dc.contributor.authorBustamante, Mario J.
dc.contributor.authorGoyette, Bill
dc.contributor.authorThomas, Stephen III
dc.contributor.authorElliott, Kenneth R.
dc.date.accessioned2016-05-24T21:26:53Z
dc.date.available2016-05-24T21:26:53Z
dc.date.issued1998-12
dc.identifier.citationIEEE Transactions on Microwave Theory and Techniques, V. 46, No. 12, pp. 2330-2337, December 1998en_US
dc.identifier.urihttp://hdl.handle.net/10945/48700
dc.descriptionThe article of record as published may be found at http://dx.doi.org/10.1109/22.739220en_US
dc.description.abstractA measurement system for internal node testing of integrated circuits using a micromachined photoconductive sampling probe is described and characterized. Special emphasis is placed upon the system performance, demonstrating how absolute voltage measurements are achieved in a dc-to-mm-wave bandwidth. The feasibility of the setup is illustrated using an InP heterojunction bipolar transistor frequency divider. Detailed waveforms at different circuit nodes and the corresponding propagation delays from within this circuit at operating frequencies up to 10 GHz are presented. The results demonstrate for the first time the use of photoconductive probes for calibration-free, absolute-voltage, dc-coupled potential measurements in high-frequency and high-speed integrated circuits.en_US
dc.description.sponsorshipThis work was sponsored by the National Science Foundation through the Center for Ultrafast Optical Science by the AFOSR, Air Force Materiel Command, USAF and by the U.S. Navyen_US
dc.publisherIEEEen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleAbsolute potential measurements inside microwave digital IC's using a micromachined photoconductive sampling probeen_US
dc.typeArticleen_US
dc.contributor.corporateNaval Postgraduate School (U.S.)en_US
dc.contributor.departmentElectrical and Computer Science
dc.subject.authorIntegrated-circuit testingen_US
dc.subject.authorMicrowave measurementsen_US
dc.subject.authorNondestructive testingen_US
dc.subject.authorPhotoconductive measurementsen_US
dc.subject.authortime-domain measurementsen_US
dc.subject.authorvoltage measurementsen_US
dc.description.funderSTC PHY 8920108, Grant DOD-G-F49620-95-1-0027, Contract N62271-97-M-1318en_US


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