Historical perspective on radiation effects in III–V devices
Weatherford, Todd R.
Anderson, Wallace T. Jr.
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A historical review of radiation effects on III–V semiconductor devices is presented. The discussion ranges from examining early material and device studies to present-day understanding of III–V radiation effects. The purpose of this paper is to provide present researchers with a summary of discoveries and lessons learned from previous failures and successes.
The article of record as published may be found at http://dx.doi.org/10.1109/TNS.2003.813124
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