SEE analysis of digital InP-based HBT circuits at gigahertz frequencies
Weatherford, Todd R.
Schiefelbein, Peter K.
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A device/circuit simulation is used to analyze a gigahertz clocked emitter-coupled logic circuit being perturbed by a single event. Results provide an understanding of charge collection in the heterojunction bipolar transistor. A technique for single-event hardening is demonstrated by simulation.
The article of record as published may be found at http://dx.doi.org/10.1109/23.983160IEEE Transactions on Nuclear Science, V. 48, No. 6, pp. 1980-1986, December 2001
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