Soft error immune GaAs circuit technologies

Abstract

Cosmic radiation induced soft errors present a major difficulty for space applications that utilize digital GaAs circuits and systems. Techniques to reduce soft error sensitivity by 5 orders of magnitude or more, to sufficient levels for safe implemen[ta]tion of GaAs ICs in space applications are presented. These results show that the need for redundancy and error correction is eliminated. Space systems will benefit by reduced power and area requirements, plus a substantial improvement in system performance over present radiation hardened silicon-based technologies.