Soft error immune GaAs circuit technologies

dc.contributor.author	Weatherford, T.R.
dc.contributor.author	Fouts, D.J.
dc.contributor.author	Marshall, P.W.
dc.contributor.author	Marshall, C.J.
dc.contributor.author	Dietrich, H.
dc.date.accessioned	2016-05-26T22:21:33Z
dc.date.available	2016-05-26T22:21:33Z
dc.date.issued	1996-11
dc.identifier.uri	https://hdl.handle.net/10945/48747
dc.description	The article of record as published may be found at http://dx.doi.org/10.1109/GAAS.1996.567901	en_US
dc.description.abstract	Cosmic radiation induced soft errors present a major difficulty for space applications that utilize digital GaAs circuits and systems. Techniques to reduce soft error sensitivity by 5 orders of magnitude or more, to sufficient levels for safe implemen[ta]tion of GaAs ICs in space applications are presented. These results show that the need for redundancy and error correction is eliminated. Space systems will benefit by reduced power and area requirements, plus a substantial improvement in system performance over present radiation hardened silicon-based technologies.	en_US
dc.publisher	IEEE	en_US
dc.rights	This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.	en_US
dc.title	Soft error immune GaAs circuit technologies	en_US
dc.type	Article	en_US
dc.contributor.corporate	Naval Postgraduate School (U.S.)	en_US
dc.contributor.department	Electrical and Computer Engineering	en_US