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dc.contributor.authorWeatherford, T.R.
dc.contributor.authorFouts, D.J.
dc.contributor.authorMarshall, P.W.
dc.contributor.authorMarshall, C.J.
dc.contributor.authorDietrich, H.
dc.date.accessioned2016-05-26T22:21:33Z
dc.date.available2016-05-26T22:21:33Z
dc.date.issued1996-11
dc.identifier.urihttp://hdl.handle.net/10945/48747
dc.descriptionThe article of record as published may be found at http://dx.doi.org/10.1109/GAAS.1996.567901en_US
dc.description.abstractCosmic radiation induced soft errors present a major difficulty for space applications that utilize digital GaAs circuits and systems. Techniques to reduce soft error sensitivity by 5 orders of magnitude or more, to sufficient levels for safe implemen[ta]tion of GaAs ICs in space applications are presented. These results show that the need for redundancy and error correction is eliminated. Space systems will benefit by reduced power and area requirements, plus a substantial improvement in system performance over present radiation hardened silicon-based technologies.en_US
dc.publisherIEEEen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleSoft error immune GaAs circuit technologiesen_US
dc.typeArticleen_US
dc.contributor.corporateNaval Postgraduate School (U.S.)en_US
dc.contributor.departmentElectrical and Computer Engineeringen_US


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