Higher order parametric X-ray spectra in mosaic graphite and single silicon crystals

Abstract

We have observed up to eight orders (n) in the spectra of parametric x-radiation, in the range 5-40 keV, produced by the interaction of a 90 Mev electron beam with mosaic graphite and 90 and 35 Mev beams with single silicon crystals. The measured yields and intensity ratios, I(2)/I(n= I), in graphite are not in agreement with the theory of PXR for mosaic crystals. In comparison, the yield and ratios of intensities in silicon are close to the predictions of PXR theory for perfect crystals. The bandwidths of spectral lines measured in both silicon and graphite are in good agreement with theoretical predictions, and are determined by the angular field of view of the detector.