Naval Postgraduate School
A comparison of redundant inverter topologies to improve voltage source inverter reliability
Julian_Oriti_A_Comparison.pdf (1.412Mb)Date
2007-09Metadata
Show full item recordAbstract
For applications sensitive to reliability, typical voltage-source inverters (VSIs) cannot always meet the reliability requirements. In these cases, some method of redundancy is used to improve system reliability. This paper compares the reliability of two redundant VSI circuit topologies to a typical VSI circuit. The redundant circuits function normally after the failure (open or short) of any single component, including the controller, current and voltage sensors, capacitors, insulated gate bipolar transistors, and power diodes. The parts count method of reliability comparison that is described in MIL-HDBK-217F is used to compare the reliability functions for the three circuit topologies.
Description
The article of record as published may be found at http://dx.doi.org/10.1109/TIA.2007.904436
Rights
This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.Collections
Related items
Showing items related by title, author, creator and subject.
-
Stress and Reliance Decisions [video]
(2018);The focus of the current study is to examine reliance on automation using a decision making framework. Specifically, the decision to rely on automation under stressful conditions. Stress consumes executive resources (Hermans ... -
Composite failure criterion - probabilistic formulation and geometric interpretation.
(Monterey, California. Naval Postgraduate School, 1988);The objective of this investigation is to derive the reliability and the associated probabilistic failure criterion for composite materials under combined stress. In the analytical derivation, the concept of joint ... -
ASSESSMENT OF EXTERNAL RELIABILITY DATA SOURCES AND RELIABILITY PREDICTIONS OF COMPLEX SYSTEMS IN EARLY SYSTEM DESIGN
(Monterey, CA; Naval Postgraduate School, 2018);Two common reliability prediction methods are the traditional method and physics of failure method. Each method requires accurate failure data in order to fully assess a system’s durability. This is particularly important ...
