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dc.contributor.authorJulian, Alexander L.
dc.contributor.authorOriti, Giovanna
dc.dateSeptember/October 2007
dc.date.accessioned2017-12-20T18:47:49Z
dc.date.available2017-12-20T18:47:49Z
dc.date.issued2007-09
dc.identifier.citationA.L. Julian, G. Oriti, "A comparison of redundant inverter topologies to improve voltage source inverter reliability", IEEE Transactions on Industry Applications, Vol. 43, No.5, September/October 2007, pp. 1371-1378.en_US
dc.identifier.urihttp://hdl.handle.net/10945/56452
dc.descriptionThe article of record as published may be found at http://dx.doi.org/10.1109/TIA.2007.904436
dc.description.abstractFor applications sensitive to reliability, typical voltage-source inverters (VSIs) cannot always meet the reliability requirements. In these cases, some method of redundancy is used to improve system reliability. This paper compares the reliability of two redundant VSI circuit topologies to a typical VSI circuit. The redundant circuits function normally after the failure (open or short) of any single component, including the controller, current and voltage sensors, capacitors, insulated gate bipolar transistors, and power diodes. The parts count method of reliability comparison that is described in MIL-HDBK-217F is used to compare the reliability functions for the three circuit topologies.en_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.titleA comparison of redundant inverter topologies to improve voltage source inverter reliabilityen_US
dc.typeArticleen_US
dc.contributor.corporateNaval Postgraduate School (U.S.)en_US
dc.contributor.departmentElectrical & Computer Engineeringen_US
dc.subject.authorMean time between failure (MTBF)en_US
dc.subject.authorRedundancy
dc.subject.authorReliability
dc.subject.authorVoltage-source inverter (VSI)


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