Strong terahertz absorption using SiO2/Al based metamaterial structures
Chamberlain, Peter Robrish, Jérôme Faist
MetadataShow full item record
Metamaterial absorbers with nearly 100% absorption in the terahertz (THz) spectral band have been designed and fabricated using a periodic array of aluminum (Al) squares and an Al ground plane separated by a thin silicon dioxide (SiO2) dielectric film. The entire structure is less than 1.6 mm thick making it suitable for the fabrication of microbolometers or bi-material sensors for THz imaging. Films with different dielectric layer thicknesses exhibited resonant absorption at 4.1, 4.2, and 4.5 THz with strengths of 98%, 95%, and 88%, respectively. The measured absorption spectra are in good agreement with simulations using finite element modeling.
The article of record as published may be found at http://dx.doi.org/10.1063/1.3693407
Showing items related by title, author, creator and subject.
Apostolos, Karamitros (Monterey, California. Naval Postgraduate School, 2011-09);The terahertz (THz) region of the electromagnetic spectrum covers frequencies ranging from approximately 100 GHz to 10 THz. This region of the spectrum has not been fully utilized due to the lack of compact and efficient ...
Carlisle, James Allen (1972-12);Light from a neodymium doped glass laser was focused in hydrogen gas at pressures from 20 millitorr to 62 atmospheres in order to produce optical breakdown of the gas. In the cases where breakdown was experienced, absorption ...
Design and characterization of terahertz-absorbing nano-laminates of dielectric and metal thin films Bolakis, Christos; Grbovic, Dragoslav; Lavrik, Nickolay V; Karunasiri, Gamani (2010-01-01);A terahertz-absorbing thin-film stack, containing a dielectric Bragg reflector and a thin chromium metal film, was fabricated on a silicon substrate for applications in bi-material terahertz (THz) sensors. The Bragg reflector ...