The applicability of x-ray diffraction methods of stress measurement to naval structures with an investigation of the stress distribution in a stiffened plate
Brown, Melvin Wilbur
Riley, William Steven
Evans, J. Harvey
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The X-ray diffraction method of stress measurement is the only known means of determining absolute stress magnitudes without measurements in the unstressed condition. It is the objective of this thesis to investigate the feasibility of using this method in analysis of naval structures both aboard ship and on models.
This thesis document was issued under the authority of another institution, not NPS. At the time it was written, a copy was added to the NPS Library collection for reasons not now known. It has been included in the digital archive for its historical value to NPS. Not believed to be a CIVINS (Civilian Institutions) title.
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