Constant-Depth Scratch Test for the Quantification of Interfacial Shear Strength at Film-Substrate Interfaces
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Authors
Dutta, Indranath
Lascurain, David P.
Subjects
Advisors
Date of Issue
1996-08-20
Date
Publisher
The Government of the United States of America, as represented by the Secretary of the Navy, Washington, DC (US)
Language
Abstract
A Constant-Depth Scratch Test (CDST) technique to quantitatively
determine the shear strength of interfaces between
thin metallic or non-metallic films and metal or ceramic
substrates is revealed. The test overcomes two problems
associated with other types of scratch tests, namely the
instrumental complexity required for real-time detection of
interfacial failure, and the inability to quantify interfacial
strength. These problems are circumvented by maintaining a
constant depth during scratching through the coating and the
substrate, monitoring the horizontal and vertical forces to
sustain the constant depth scratch, and finally by using a
model to analyze the test results to quantify the interfacial
shear strength. Unlike other scratch tests, this test is capable
of measuring interfacial shear strength as a function of
position on the film-substrate sample.
Type
Patent
Description
Patent
Series/Report No
Department
Organization
Naval Postgraduate School (U.S.)
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NPS Report Number
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This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.