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Quantitative energy dispersive x-ray spectrometry using an Emispec Vision system

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Author
Kasemodel, Carlos A.
Date
1999-12
Advisor
Fox, Alan G.
Luscombe, James
Second Reader
Rajagopalan, Nagarajan
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Abstract
The purpose of this work was to investigate the use of an Emispec Vision system to analyze energy dispersive x-ray spectra (EDS) obtained with the Topcon 002B transmission electron microscope (TEM) in the Materials Science Laboratory at the Naval Postgraduate School. A series of tests performed with a standard NiO sample revealed that the TEM column and EDS detector were operating in a satisfactory fashion. NiO spectra acquired with different sample tilt- angles were used to test the Emispec software. An improved setup configuration, in which accurate quantification is obtained with the sample at zero tilt-angle, was developed. Quantification tests performed with TiO2, Cu-Al2O3 and alumina- YAG (with 2.5% TiO2) samples confirmed the accuracy of the new software setup. Line profiles across the alumina-YAG interfaces were also recorded to verify the performance of the Emispec system for spectrum profile acquisition and to investigate the Ti distribution at the interface of the alumina-YAG heat-treated sample
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This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.
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http://hdl.handle.net/10945/8877
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