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dc.contributor.advisorDyer, John N.
dc.contributor.authorNelson, William Jerome, Jr.
dc.dateJune 1967
dc.date.accessioned2012-08-29T23:31:07Z
dc.date.available2012-08-29T23:31:07Z
dc.date.issued1967-06
dc.identifier.urihttp://hdl.handle.net/10945/12115
dc.description.abstractThe establishment of a program to study the effects of radiation on solid state electronic devices is discussed. The design and testing of experimental equipment used in connection with this project, and the techniques developed for the exposure of devices to the electron beam of the NPGS LINAC, form the main topics of this paper. Also included are the results of a beam profile analysis done using calorimetric techniques, and some results concerning the behavior of transistors exposed to the LINAC electron beam.en_US
dc.description.urihttp://www.archive.org/details/establishmentofr00nels
dc.language.isoen_US
dc.publisherMonterey, California. U.S. Naval Postgraduate Schoolen_US
dc.rightsThis publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States.en_US
dc.subject.lcshNuclear physicsen_US
dc.titleThe establishment of a radiation effects program at the NPGS linear accelerator facility.en_US
dc.typeThesisen_US
dc.contributor.corporateNaval Postgraduate School
dc.contributor.departmentDepartment of Physics
dc.subject.authorSolid state radiation damageen_US
dc.subject.authorDosimetry by calorimetryen_US
dc.subject.authorLINAC intensity profileen_US
dc.subject.authorRadiation effects in transistorsen_US
dc.description.serviceLieutenant, United States Navyen_US
etd.thesisdegree.nameM.S. in Physicsen_US
etd.thesisdegree.levelMastersen_US
etd.thesisdegree.disciplinePhysicsen_US
etd.thesisdegree.grantorNaval Postgraduate Schoolen_US
dc.description.distributionstatementApproved for public release; distribution is unlimited.


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