The use of backscattered electron imaging mode to assess the effect of fine dispersions on development of superplastic microstructures in Al-Mg alloys
dc.contributor.advisor | McNelley, Terry R. | |
dc.contributor.author | Coleman, Michael Thomas. | |
dc.date | June 1993 | |
dc.date.accessioned | 2014-03-26T23:23:12Z | |
dc.date.available | 2014-03-26T23:23:12Z | |
dc.date.issued | 1993-06 | |
dc.identifier.uri | https://hdl.handle.net/10945/39777 | |
dc.description.abstract | Microstructural evolution during thermomechanical processing of several Al-Mg alloys was studied using backscattered orientation contrast imaging in the scanning electron microscope. The microstructural evolution in A1-8Mg-0.1Zr was characterized in three phases: (a) in the initial stages, precipitation occurred on prior boundaries and microbands were observed in the grain interiors; (b) during intermediate stages, higher order microbands were observed and precipitates formed throughout the microstructure on both lower- and higher-order microbands; (c) in the final stages, equiaxed regions appeared around larger particles suggesting particle stimulated nucleation of recrystallization. A higher Mg-content alloy (A1-10Mg0.1Zr) was compared at two stages and seen to provide a greater volume fraction of similar sized precipitate. A finer recrystallized microstructure and greater superplastic response was observed in the Al-10Mg-0.1Zr alloy. | en_US |
dc.description.uri | http://archive.org/details/theuseofbackscat1094539777 | |
dc.format.extent | 65 p. | en_US |
dc.language.iso | en_US | |
dc.publisher | Monterey, California. Naval Postgraduate School | en_US |
dc.rights | This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States. | en_US |
dc.title | The use of backscattered electron imaging mode to assess the effect of fine dispersions on development of superplastic microstructures in Al-Mg alloys | en_US |
dc.type | Thesis | en_US |
dc.contributor.secondreader | Neighbours, John | |
dc.contributor.corporate | Naval Postgraduate School (U.S.) | |
dc.contributor.department | Department of Physics | |
dc.subject.author | Backscattered Electron Imaging mode | en_US |
dc.subject.author | Superplastic | en_US |
dc.description.service | Lieutenant Commander, United States Navy | en_US |
etd.thesisdegree.name | M.S. in Engineering Science | en_US |
etd.thesisdegree.level | Masters | en_US |
etd.thesisdegree.discipline | Engineering Science | en_US |
etd.thesisdegree.grantor | Naval Postgraduate School | en_US |
dc.description.distributionstatement | Approved for public release; distribution is unlimited. |
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