Strong terahertz absorption using thin metamaterial structures
dc.contributor.author | Alves, Fabio | |
dc.contributor.author | Kearney, Brian | |
dc.contributor.author | Grbovic, Dragoslav | |
dc.contributor.author | Lavrik, Nickolay V. | |
dc.contributor.author | Karunasiri, Gamani | |
dc.date.accessioned | 2018-03-12T22:55:59Z | |
dc.date.available | 2018-03-12T22:55:59Z | |
dc.date.issued | 2012-01-01 | |
dc.identifier.citation | Journal Name: Applied Physics Letters; Journal Volume: 100; Journal Issue: 11 | |
dc.identifier.other | OSTI ID: 1039591 | |
dc.identifier.uri | https://hdl.handle.net/10945/57267 | |
dc.description | The article of record as published may be found at http://dx.doi.org/10.1063/1.3693407 | |
dc.description.abstract | Metamaterial absorbers with nearly 100% absorption in the terahertz (THz) spectral band have been designed and fabricated using a periodic array of aluminum (Al) squares and an Al ground plane separated by a thin silicon dioxide (SiO{sub 2}) dielectric film. The entire structure is less than 1.6 mm thick making it suitable for the fabrication of microbolometers or bi-material sensors for THz imaging. Films with different dielectric layer thicknesses exhibited resonant absorption at 4.1, 4.2, and 4.5 THz with strengths of 98%, 95%, and 88%, respectively. The measured absorption spectra are in good agreement with simulations using finite element modeling. | en_US |
dc.description.sponsorship | Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Center for Nanophase Materials Sciences | |
dc.description.sponsorship | USDOE Office of Science (SC) | |
dc.language.iso | en_US | |
dc.rights | This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. Copyright protection is not available for this work in the United States. | en_US |
dc.subject | Materials Science | |
dc.subject | Absorption | |
dc.subject | Absorption Spectra | |
dc.subject | Aluminium | |
dc.subject | Dielectric Materials | |
dc.subject | Fabrication | |
dc.subject | Sensors | |
dc.subject | Silicon | |
dc.subject | Silicon Compounds | |
dc.subject | Simulation | |
dc.subject | Thin Films | |
dc.title | Strong terahertz absorption using thin metamaterial structures | en_US |
dc.type | Article | en_US |
dc.description.funder | DE-AC05-00OR22725 |